Measurement and analysis
Authors: Van Den Eeden SK; Ritz B; Cobb K
In: Nelson LM, Tanner CM, van den Eeden SK, MacGuire VM, editors. Neuroepidemiology: From principles to practice. New York: Oxford University Press; 2004.
Authors: Van Den Eeden SK; Ritz B; Cobb K
In: Nelson LM, Tanner CM, van den Eeden SK, MacGuire VM, editors. Neuroepidemiology: From principles to practice. New York: Oxford University Press; 2004.